This tutorial illustrates simulation of a single-event response due to heavy ion strikes on device structures and circuits of increasing complexity. Starting with a simple 2D MOSFET example, the influence of the ion impact position is shown. Furthermore, investigations on circuit level are carried out including a 6T-SRAM cell SEU. Finally, the 3D irradiation simulation capabilities are demonstrated.
Project Name: IrradiationSimulation
PDF revision of 17 September 2024
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